Thin-Film Transistors
Cherie R. Kagan, Paul Andry
Assesses the development, properties, processing, patterning, and device characterization of thin film transistors based on amorphous polycrystalline silicon. Tackles the challenges associated with designing high-resolution, large-area displays.
Категории:
Год:
2003
Издание:
1
Издательство:
CRC Press
Язык:
english
Страницы:
624
ISBN 10:
0824709594
ISBN 13:
9780824709594
Файл:
PDF, 4.51 MB
IPFS:
,
english, 2003